15

Review on the Modeling of Electrostatic MEMS

Year:
2010
Language:
english
File:
PDF, 660 KB
english, 2010
35

The robustness of an algorithm applied in wafer-level material property extraction

Year:
2016
Language:
english
File:
PDF, 704 KB
english, 2016
47

Robust continuous piecewise linear regression model with multiple change points

Year:
2018
Language:
english
File:
PDF, 1.18 MB
english, 2018